Wang H., Zhang Y., Haugan T., Zhang D., Huang J., Wu J., Sebastian M.A., Jian J., Gautam B., Ebbing C., Ogunjimi V., Panth M.
Ключевые слова: HTS, YBCO, substitution, doping effect, nanorods, thin films, multilayered structures, interfaces, X-ray diffraction, lattice parameter, pinning, temperature dependence, magnetic field dependence, fabrication, PLD process, substrate SrTiO3, critical caracteristics, Jc/B curves, pinning force, experimental results
Molina-Luna L., Jiang T., Alff L., Major M., Karabas N., Pietralla N., Schafer N., Gunzing D., Arzumanov A., Motta-Meira D., Ollefs K., Komissinskiy P., Arnold M., Wende H., Lutzenkirchen-Hecht D.
Ключевые слова: HTS, thin films, vortex dynamics, defects columnar, modeling, numerical analysis
Ключевые слова: measurement technique, vortex structures, sensors, HTS, YBCO, thin films
Sun Z., Shao Y., Baraissov Z., Muller D.A., Thompson M.O., Liepe M.U., Porter R.D., Shpani L., Oseroff T.
Ключевые слова: electrochemical process, cavity, fabrication, LTS, Nb3Sn, thin films, roughness, X-ray diffraction, microstructure, resistive transition
Hanisch J., Chen M., Iida K., Ikuta H., Tarantini C., Yamamoto A., Wang C., Gao H., Hata S., Kondo K., Naito M., Guo Z., Hatano T., Saito H., Qin D.
Zhang Y., Zhang D., Wu J., Sebastian M.A., Huan J., Gautam B., Ogunjimi V., Panth M., Haugan T.*2 Wang H.
Ключевые слова: HTS, YBCO, thin films, nanocomposites, nanorods, interfaces, pinning centers artificial, defects columnar, critical caracteristics, critical current, magnetic field dependence, angular dependence, mechanical properties, strain effects, microstructure, lattice parameter, stacking fault, Jc/B curves, pinning force, experimental results
Ключевые слова: neural networks, microwave devices, HTS, YBCO, thin films, substrate single crystal, filter, modeling, design
Ключевые слова: HTS, Bi2212, thin films, sol gel process, substrate LaAlO3, oxygen, control systems, X-ray diffraction, resistivity, temperature dependence, critical temperature, current-voltage characteristics, critical caracteristics, critical current density, texture, microstructure, experimental results
Ключевые слова: MgB2, substrate SiC, CVD process, fabrication, films epitaxial, thin films, microstructure, resistive transition, resistivity, temperature dependence
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